关于《催化化学与研究方法》上课的通知.doc
关于《催化化学与研究方法》上课的通知.doc
OUTLINE COURSE ON POWDER X-RAY DIFFRACTION - MATERIALS CHARACTERIZATION BY C. KAPPENSTEIN EMERITUS PROFESSOR, UNIVERSITY OF POITIERS I – CRISTALLOGRAPHY 1. – POINT LATTICES 1.1. - Crystal space lattice 1.1.1. - Definitions 1.1.2. - Lines and planes 1.1.3. - Set of planes - Miller indices 1.2. - Reciprocal lattice 1.2.1. - Diffraction condition 1.2.2. - Properties of the reciprocal lattice 1.3. - Applications of reciprocal lattice 1.3.1. - Miller indices (h k l)of a set of planes defined by two lines 1.3.2. - Indices u v w of a line defined by two planes 1.3.3. - Angle between two faces of a crystal 1.3.4. - Building the reciprocal lattice 1.3.5. - d-spacing determination 1.4. - Basis changes 2. – CRYSTALLOGRAPHIC GROUPS 2.1. - Crystal lattices 2.2 -. 14 Bravais lattices 2.3. - Space groups 2.3.1. - 7 one-dimensional space groups 2.3.2. - 17 two-dimensional space groups 2.3.3. - 230 three-dimensional space groups II – X-RAY DIFFRACTION 1. – INTRODUCTION 2. – INTERACTION BETWEEN X-RAYS AND MATTER 2.1. - Fundamental processes 2.1.1. – Photoelectric effect 2.1.2. – Compton scattering 2.1.3. – Fluorescence 2.1.4. – Thomson scattering 2.2. - Absorption of X-rays 2.3. - Thomson coherent diffusion 2.3.1. – Scattering by a single electron 2.3.2. – Scattering by an atom: atom scattering factor 3. - DIFFRACTION BY A PERIODIC LATTICE 3.1. - Diffraction condition 3.2. – Ewald’s sphere 3.3. – Bragg’s relation 3.4. - Structure Factor 3.5. – Systematic absences 3.6. - Lorentz-polarization Factor Lp 3.7. - Debye-Waller factor DW 3.8. - Multiplicity factor Mhkl 3.9. – General relation 3.10. – Peak width – Scherrer’s relation III – POWDER DIFFRACTOMETER 1. – SOURCE OF X-RAYS 1.1. – X-ray tube 1.2. – White radiation 1.3. – Characteristic lines 1.4. – Take-off angle 2. - DETECTION OF X-RAYS 2.1. - Proportional scintillation detector 2.2. – Linear detector 2.3. – Counting statistics 2.4. – Standard deviation and intensity 2.5. – Stability of the X-ray source 3. – SAMPLING 3.1. – Sample preparation 3.2. – different sample holders 4. – SIZE OF THE IRRADIATED AREA 4.1. – Sample holder 4.2. – Determination of the length L 4.3. – Determination of the width l 4. - DIFFRACTOMETER 4.1. – Measurement circle 4.2. - Focalization circle 4.3. – Opening slits 5. - CORRECTIONS 5.1. – Zero correction 5.2. – Sample displacement 5.3. – Sample absorption 5.4. – Flatness correction 5.5. – Axial divergence 5.6. – Displacement determination 6. – PEAK PROFILE ANALYSIS 7. – DATA TREATMENT