附件1：课程大纲.docx

On Wednesday 24 August 2016, instrument check for SEM and TEM will be made together with lab manager Prof. Miao Shu to be prepared for practical exercises SEM1 to SEM-8 and TEM-1 to TEM-8. 24 to 26 August 2016 Lectures Exercises Wednesday Thursdsay Friday 2016/8/24 2016/8/25 2016/8/26 8:30-10:00 Lecture 1-1 Lecture 2-1 Lecture 3-1 10:00-10:30 break break break 10:30-12:00 Lecture 1-2 Lecture 2-2 Lecture 3-2 12:00-14:00 break Break Break 14:00-15:00 SEM-1 TEM-1 SEM-4 TEM-7 SEM-7 TEM-7 15:00-16:00 SEM-2 TEM-2 SEM-5 TEM-8 SEM-8 TEM-8 16:00-17:00 SEM-3 TEM-3 SEM-6 TEM-9 SEM-9 TEM-9 Lectures Lecture 1-1, Basics of the scanning electron microscope I (SEM) de-Broglie wave length, Lorentz force, electron sources, electron lenses (what does a lens do?),detectors, microscope column, beam-specimen interaction, excitation volume, stigmators, deflectors Lectures 1-2 + 1-3, Basics of the scanning electron microscope II (SEM) beam-specimen interaction, detectors, secondary electrons (SE), backscattered electrons (BSE), depth offocus, in-lens detection (high-resolution SEM), avoiding specimen charging, C s /C C -corrected SEM (ultra-high resolution) Lecture 2-1, Basics of the transmission electron microscope I (TEM) history, virology, fundamentals, lens in wave optics, the 3-stage TEM, optical path for imaging and diffraction, resolution limit, Fourier optics, diffraction absorption contrast Lecture 2-2, Basics of the transmission electron microscope II (TEM) phase contrast (high-resolution TEM), phase-amplitude diagrams,/4 phase plate, phase-contrast transfer function, point resolution, delocalisation, Cs-corrected microscope, contrast simulation (multisclice method), focal series reconstruction Lecture 3-1, Diffraction and elemental analysis in the transmission electron microscope analogies and differences between electron diffraction and x-ray diffraction, selected area electron diffraction (SAED),from parallel to convergent illumination, convergent beam electron diffraction (CBED),scanning transmission electron microscopy (STEM), analytical electron microscopy (AEM), x-ray spectroscopy (EDXS, WDXS, EMPA), electron energy-loss spectroscopy (EELS) Lecture 3-2, Some practical advice (SEM + TEM) sample preparation, media for image acquisition, avoiding beam damage Practical Exercises SEM (courses SEM-1 to SEM-3 given by Prof. Feldhoff;courses SEM-4 to SEM9 given by lab manager Prof. Miao Shu ) Demonstration of effect of working distance (objective lens focal length) on resolution and depth of focus; secondary electron imaging and energy-dispersive Xray spectroscopy. TEM (all courses given by Prof. Feldhoff) Demonstration of absorption contrast (bright-field, dark field) and selected area electron diffraction;how to avoid damage of beam-sensitive materials during observation.